Главная
 Публикации
 Проекты
 Обучение
 Продукция
 О центре
 Сотрудники
 Контакты

/ / X-ray diffraction using focused-ion-beam-prepared single crystals

X-ray diffraction using focused-ion-beam-prepared single crystals 
14 апреля 2020 года

20200617-02 Tina Weigel, Claudia Funke, Matthias Zschornak, Thomas Behm, Hartmut Stöcker, Tilmann Leisegang and Dirk C. Meyer X-ray diffraction using focused-ion-beam-prepared single crystals. Journal of Applied Crystallography, 2020, 2020, 53 (3), 614–622. doi: 10.1107/S1600576720003143 IF 3.527

Метки: ,

/ / X-ray diffraction using focused-ion-beam-prepared single crystals